Учебник по промышленной статистике


Список использованной литературы - часть 35

Optimal properties of exponentially weighted forecasts. Journal of the American Statistical Association, 55, 299-306.

Nachtsheim, C. J. (1979). Contributions to optimal experimental design. Ph.D. thesis, Department of Applied Statistics, University of Minnesota.

Nachtsheim, C. J. (1987). Tools for computer-aided design of experiments. Journal of Quality Technology, 19, 132-160.

Nelder, J. A., & Mead, R. (1965). A Simplex method for function minimization. Computer Journal, 7, 308-313.

Nelson, L. (1984). The Shewhart control chart - tests for special causes. Journal of Quality Technology, 15, 237-239.

Nelson, L. (1985). Interpreting Shewhart X-bar control charts. Journal of Quality Technology, 17, 114-116.

Nelson, W. (1982). Applied life data analysis. New York: Wiley.

Nelson, W. (1990). Accelerated testing: Statistical models, test plans, and data analysis. New York: Wiley.

Neter, J., Wasserman, W., & Kutner, M. H. (1985). Applied linear statistical models: Regression, analysis of variance, and experimental designs. Homewood, IL: Irwin.

Neter, J., Wasserman, W., & Kutner, M. H. (1989). Applied linear regression models (2nd ed.). Homewood, IL: Irwin.

Neyman, J., & Pearson, E. S. (1931). On the problem of k samples. Bulletin de l'Academie Polonaise des Sciences et Lettres, Ser. A, 460-481.

Neyman, J., & Pearson, E. S. (1933). On the problem of the most efficient tests of statistical hypothesis. Philosophical Transactions of the Royal Society of London, Ser. A, 231, 289-337.

Nisbett, R. E., Fong, G. F., Lehman, D. R., & Cheng, P. W. (1987). Teaching reasoning. Science, 238, 625-631.

Noori, H. (1989). The Taguchi methods: Achieving design and output quality. The Academy of Management Executive, 3, 322-326.

Nunally, J. C. (1970). Introduction to psychological measurement. New York: McGraw-Hill.

Nunnally, J. C. (1978). Psychometric theory. New York: McGraw-Hill.

Nussbaumer, H. J. (1982). Fast Fourier transforms and convolution algorithms (2nd ed.). New York: Springer-Verlag.

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